dc.contributor.author |
KOUTRAS, MV |
en |
dc.contributor.author |
PAPADOPOULOS, GK |
en |
dc.contributor.author |
PAPASTAVRIDIS, SG |
en |
dc.date.accessioned |
2014-06-06T06:42:31Z |
|
dc.date.available |
2014-06-06T06:42:31Z |
|
dc.date.issued |
1993 |
en |
dc.identifier.issn |
0018-9529 |
en |
dc.identifier.uri |
http://62.217.125.90/xmlui/handle/123456789/670 |
|
dc.subject |
2-DIMENSIONAL CONSECUTIVE-K-OUT-OF-N SYSTEM |
en |
dc.subject |
RELIABILITY BOUND |
en |
dc.subject |
WEIBULL LIMIT THEOREM |
en |
dc.subject.classification |
Computer Science, Hardware & Architecture |
en |
dc.subject.classification |
Computer Science, Software Engineering |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
POISSON CONVERGENCE |
en |
dc.title |
RELIABILITY OF 2-DIMENSIONAL CONSECUTIVE-K-OUT-OF-N - F SYSTEMS |
en |
heal.type |
journalArticle |
en |
heal.language |
English |
en |
heal.publicationDate |
1993 |
en |
heal.abstract |
This paper derives lower & upper reliability bounds for the 2-dimensional consecutive k-out-of-n:F system (Salvia Lasher, 1990) with independent but not necessarily identically distributed components. A Weibull limit theorem is proved for system time-to-failure for i.i.d. components. |
en |
heal.publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
en |
heal.journalName |
IEEE TRANSACTIONS ON RELIABILITY |
en |
dc.identifier.issue |
4 |
en |
dc.identifier.volume |
42 |
en |
dc.identifier.isi |
ISI:A1993NE25500026 |
en |
dc.identifier.spage |
658 |
en |
dc.identifier.epage |
661 |
en |