dc.contributor.author |
Kerber, S |
en |
dc.contributor.author |
Barr, T |
en |
dc.contributor.author |
Mann, G |
en |
dc.contributor.author |
Brantley, W |
en |
dc.contributor.author |
Papazoglou, E |
en |
dc.contributor.author |
Mitchell, J |
en |
dc.date.accessioned |
2014-06-06T06:43:33Z |
|
dc.date.available |
2014-06-06T06:43:33Z |
|
dc.date.issued |
1998 |
en |
dc.identifier.uri |
http://dx.doi.org/10.1361/105994998770347774 |
en |
dc.identifier.uri |
http://62.217.125.90/xmlui/handle/123456789/1368 |
|
dc.subject |
Growth Mechanism |
en |
dc.subject |
Metal Ion |
en |
dc.subject |
X Ray Diffraction |
en |
dc.subject |
X Ray Photoelectron Spectroscopy |
en |
dc.title |
The complementary nature of x-ray photoelectron spectroscopy and angle-resolved x-ray diffraction part II: Analysis of oxides on dental alloys |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1361/105994998770347774 |
en |
heal.publicationDate |
1998 |
en |
heal.abstract |
X-ray photoelectron spectroscopy (XPS) and angle-resolved x-ray diffraction (ARXRD) were used to analyze the oxide layer on three palladium-gallium-based dental casting alloys. The oxide layers were approximately 10 Μm thick. The use of the techniques helped to determine which mechanism was responsible for oxide formation—either (a) oxide layer growth via diffusion of oxygen through the scale to the metal, causing |
en |
heal.journalName |
Journal of Materials Engineering and Performance |
en |
dc.identifier.doi |
10.1361/105994998770347774 |
en |