| dc.contributor.author |
Vincent, E |
en |
| dc.contributor.author |
Papadas, C |
en |
| dc.contributor.author |
Ghibaudo, G |
en |
| dc.date.accessioned |
2014-06-06T06:43:05Z |
|
| dc.date.available |
2014-06-06T06:43:05Z |
|
| dc.date.issued |
1996 |
en |
| dc.identifier.uri |
http://62.217.125.90/xmlui/handle/123456789/1011 |
|
| dc.relation.uri |
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5436016 |
en |
| dc.relation.uri |
http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05436016 |
en |
| dc.subject |
Current Density |
en |
| dc.subject |
Electric Field |
en |
| dc.subject |
fowler nordheim |
en |
| dc.title |
Electric Field Dependence of Charge Build-up Mechanisms and Breakdown Phenomena in Thin Oxides During Fowler-Nordheim Injection |
en |
| heal.type |
journalArticle |
en |
| heal.publicationDate |
1996 |
en |
| heal.abstract |
The electric field dependence of the charge build-up mechanisms and its correlation to breakdown phenomena in thin oxides during Fowler-Nordheim electron injections has been investigated. The charge to breakdown decrease versus the electric field has been quantitatively attributed to the increase of the trapping efficiency, for various oxide thicknesses ranging between 5.5 nm and 10 nm. A relationship between the |
en |
| heal.journalName |
Journal of Socio-economics |
en |